Proceedings Paper
Strip-based parallel beam projection model for under-sampling CT system| Format | Member Price | Non-Member Price |
|---|---|---|
| $17.00 | $21.00 |
Paper Abstract
X ray CT is a vital technology for inspecting the internal structure of some objects. Various computing method models have been used to CT reconstruction. When image of the scanned object is recorded by the detector unit of finite area, the strip-based projection model is more suitable. In this paper, a simultaneous algebraic reconstruction technique (SART) for strip-based parallel beam projection model have been adopted. Furthermore, in order to reduce the radiation dose and avoid the blurring effect resulting from changes in physical and chemical properties of specimens during scanning, it is necessary to reduce the number of step-scanning. This algorithm combined with cubic spline interpolation can reconstruct high quality CT images in a small amount of data projection in numerical simulation.
Paper Details
Date Published: 24 January 2019
PDF: 8 pages
Proc. SPIE 11052, Third International Conference on Photonics and Optical Engineering, 110521C (24 January 2019); doi: 10.1117/12.2522039
Published in SPIE Proceedings Vol. 11052:
Third International Conference on Photonics and Optical Engineering
Ailing Tian, Editor(s)
PDF: 8 pages
Proc. SPIE 11052, Third International Conference on Photonics and Optical Engineering, 110521C (24 January 2019); doi: 10.1117/12.2522039
Show Author Affiliations
Shuang Zhang, Beijing Normal Univ. (China)
Key Lab. of Beam Technology (China)
Jinbang Wang, Beijing Normal Univ. (China)
Key Lab. of Beam Technology (China)
Hanxue Mei, Beijing Normal Univ. (China)
Key Lab. of Beam Technology (China)
Peng Zhou, Beijing Normal Univ. (China)
Key Lab. of Beam Technology (China)
Key Lab. of Beam Technology (China)
Jinbang Wang, Beijing Normal Univ. (China)
Key Lab. of Beam Technology (China)
Hanxue Mei, Beijing Normal Univ. (China)
Key Lab. of Beam Technology (China)
Peng Zhou, Beijing Normal Univ. (China)
Key Lab. of Beam Technology (China)
Kai Pan, Beijing Normal Univ. (China)
Key Lab. of Beam Technology (China)
Zhiguo Liu, Beijing Normal Univ. (China)
Beijing Key Lab. of Applied Optics (China)
Key Lab. of Beam Technology and Beijing Radiation Ctr. (China)
Yude Li, Beijing Normal Univ. (China)
Beijing Key Lab. of Applied Optics (China)
Key Lab. of Beam Technology and Beijing Radiation Ctr. (China)
Tianxi Sun, Beijing Normal Univ. (China)
Key Lab. of Beam Technology (China)
Beijing Radiation Ctr. (China)
Key Lab. of Beam Technology (China)
Zhiguo Liu, Beijing Normal Univ. (China)
Beijing Key Lab. of Applied Optics (China)
Key Lab. of Beam Technology and Beijing Radiation Ctr. (China)
Yude Li, Beijing Normal Univ. (China)
Beijing Key Lab. of Applied Optics (China)
Key Lab. of Beam Technology and Beijing Radiation Ctr. (China)
Tianxi Sun, Beijing Normal Univ. (China)
Key Lab. of Beam Technology (China)
Beijing Radiation Ctr. (China)
Published in SPIE Proceedings Vol. 11052:
Third International Conference on Photonics and Optical Engineering
Ailing Tian, Editor(s)
© SPIE. Terms of Use
