Share Email Print
cover

Proceedings Paper

Metal surface detection using division-of-focal-plane imaging polarimetry
Author(s): Hui Wang; Haofeng Hu; Xiaobo Li; Lin Zhao; Zijian Guan; Xiangying Kong; Tiegen Liu
Format Member Price Non-Member Price
PDF $17.00 $21.00

Paper Abstract

Imaging polarimetry has emerged over the past decades as a powerful tool to reveal the information invisible in intensity image. This paper aims at the application of division of focal plane (DoFP) imaging polarimetry in metal surface inspection. We obtain the intensity image and polarimetric image of some metal components on which there are defects, including scratch, wear, crack and burr. Experiment shows that polarimetric imaging can reduce the effect of strong reflection and improve the defect/surface contrast. The polarimetric image is more effective for metal surface inspection than the traditional intensity image.

Paper Details

Date Published: 24 January 2019
PDF: 6 pages
Proc. SPIE 11052, Third International Conference on Photonics and Optical Engineering, 110521A (24 January 2019); doi: 10.1117/12.2522015
Show Author Affiliations
Hui Wang, Tianjin Univ. (China)
Key Lab. of Opto-electronics Information Technology (China)
Hebei Normal Univ. (China)
Haofeng Hu, Tianjin Univ. (China)
Key Lab. of Opto-electronics Information Technology (China)
Qingdao National Lab. for Marine Science and Technology (China)
Xiaobo Li, Tianjin Univ. (China)
Key Lab. of Opto-electronics Information Technology (China)
Lin Zhao, Tianjin Univ. (China)
Key Lab. of Opto-electronics Information Technology (China)
Zijian Guan, Tianjin Univ. (China)
Key Lab. of Opto-electronics Information Technology (China)
Xiangying Kong, Aerospace Precision Products Co., Ltd. (China)
Tiegen Liu, Tianjin Univ. (China)
Key Lab. of Opto-electronics Information Technology (China)
Qingdao National Lab. for Marine Science and Technology (China)


Published in SPIE Proceedings Vol. 11052:
Third International Conference on Photonics and Optical Engineering
Ailing Tian, Editor(s)

© SPIE. Terms of Use
Back to Top
PREMIUM CONTENT
Sign in to read the full article
Create a free SPIE account to get access to
premium articles and original research
Forgot your username?
close_icon_gray