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Proceedings Paper

Research on noise testing and reduction of low illumination imaging module
Author(s): Kai Qiao; Shengkai Wang; Gangcheng Jiao; Hongjin Qiu ; Hongchang Cheng; Yuanyuan
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Paper Abstract

As the rapid development of back-illuminated CMOS (BI-CMOS) image sensor technology in recent years, its application prospect in the field of Low-Light-Level (LLL) night vision has been widely concerned. Therefore, LLL imaging module was developed based on BICMOS, whose 3-D noise data was obtained under different illumination conditions. The test results show that, the signal-to-noise ratio (SNR) of imaging module becomes worse with the decreasing of illumination. According to the judgement of noise, the noise power of the image in low illumination is mainly Gaussian distribution. And the image processed by spatial filtering, which efficiently reducing the imaging noise and improving the imaging quality.

Paper Details

Date Published: 12 March 2019
PDF: 5 pages
Proc. SPIE 11023, Fifth Symposium on Novel Optoelectronic Detection Technology and Application, 1102327 (12 March 2019); doi: 10.1117/12.2521984
Show Author Affiliations
Kai Qiao, Science and Technology Low-Light-Level Night Vision Lab. (China)
Kunming Institute of Physics (China)
Shengkai Wang, Science and Technology Low-Light-Level Night Vision Lab. (China)
Kunming Institute of Physics (China)
Gangcheng Jiao, Science and Technology Low-Light-Level Night Vision Lab. (China)
Kunming Institute of Physics (China)
Hongjin Qiu , Science and Technology Low-Light-Level Night Vision Lab. (China)
Kunming Institute of Physics (China)
Hongchang Cheng, Science and Technology Low-Light-Level Night Vision Lab. (China)
Kunming Institute of Physics (China)
Yuanyuan, Science and Technology Low-Light-Level Night Vision Lab. (China)
Kunming Institute of Physics (China)


Published in SPIE Proceedings Vol. 11023:
Fifth Symposium on Novel Optoelectronic Detection Technology and Application
Qifeng Yu; Wei Huang; You He, Editor(s)

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