
Proceedings Paper
Acquisition method and calibration application on hyperion hyperspectral reflectanceFormat | Member Price | Non-Member Price |
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Paper Abstract
As the most commonly used hyperspectral data source, the acquisition method of Hyperion hyperspectral reflectance became more and more important. In this study, a batch atmospheric correction method based on Second Simulation of a Satellite Signal in the Solar Spectrum radiative transfer code (6SBAC) has been presented. The 6SBAC was used MODIS synchronous atmospheric data products to obtain meteorological parameters, and set up automatic input-output parameter module to obtain Hyperion reflectance data. At the same time, using Fast Line-of-sight Atmospheric Analysis of Spectral Hypercubes (FLAASH), Quick Atmospheric Correction(QUAC) atmospheric correction methods on Hyperion satellite images, the results was compared with the synchronous hyperspectral data measured in Dunhuang test site. The authenticity of the obtained hyperspectral reflectance was verified by MODIS surface products. The results showed that the hyperspectral reflectance obtained by the three kinds of atmospheric correction methods were consistent with the measured reflectance in trend. Despite the compromises in different wavelength regions 6SBAC is found to be a better corrector method for the Hyperion hyperspectral reflectance acquisition. The precision of the 6SBAC obtained hyperspectral reflectance can meet the application requirements and improve the acquisition efficiency of Hyperion hyperspectral reflectance data.
Paper Details
Date Published: 12 March 2019
PDF: 8 pages
Proc. SPIE 11023, Fifth Symposium on Novel Optoelectronic Detection Technology and Application, 1102335 (12 March 2019); doi: 10.1117/12.2521921
Published in SPIE Proceedings Vol. 11023:
Fifth Symposium on Novel Optoelectronic Detection Technology and Application
Qifeng Yu; Wei Huang; You He, Editor(s)
PDF: 8 pages
Proc. SPIE 11023, Fifth Symposium on Novel Optoelectronic Detection Technology and Application, 1102335 (12 March 2019); doi: 10.1117/12.2521921
Show Author Affiliations
Chunyan Zhao, Anhui Institute of Optics and Fine Mechanics (China)
Univ. of Science and Technology of China (China)
Wei Wei, Anhui Institute of Optics and Fine Mechanics (China)
Meng Zhang, Anhui Institute of Optics and Fine Mechanics (China)
Univ. of Science and Technology of China (China)
Univ. of Science and Technology of China (China)
Wei Wei, Anhui Institute of Optics and Fine Mechanics (China)
Meng Zhang, Anhui Institute of Optics and Fine Mechanics (China)
Univ. of Science and Technology of China (China)
Shuai Song, PLA (China)
Xin Li, Anhui Institute of Optics and Fine Mechanics (China)
Xiaobing Zheng, Anhui Institute of Optics and Fine Mechanics (China)
Xin Li, Anhui Institute of Optics and Fine Mechanics (China)
Xiaobing Zheng, Anhui Institute of Optics and Fine Mechanics (China)
Published in SPIE Proceedings Vol. 11023:
Fifth Symposium on Novel Optoelectronic Detection Technology and Application
Qifeng Yu; Wei Huang; You He, Editor(s)
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