Proceedings Paper
The impact of drift angle control and LTAN drift towards hyperspectral solar occultation and calibration| Format | Member Price | Non-Member Price |
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Paper Abstract
The solar occultation observation or solar calibration of the payload requires the sunlight or the diffuse reflection of sunlight to enter the field of view. It’s important to consider the variation of azimuth and elevation angle from the. The article analyzes the impact of in-orbit drift angle control and LTAN drift of 8 years in-orbit towards the solar vector. On the basis on the occultation period and solar calibration period, the range of the solar driven angle, the solar observation FOV, timing of the calibration and the optimal LTAN range are analyzed. The analysis method can provide reference for similar payload design and orbital control design with solar observation requirements.
Paper Details
Date Published: 12 March 2019
PDF: 8 pages
Proc. SPIE 11023, Fifth Symposium on Novel Optoelectronic Detection Technology and Application, 1102333 (12 March 2019); doi: 10.1117/12.2521905
Published in SPIE Proceedings Vol. 11023:
Fifth Symposium on Novel Optoelectronic Detection Technology and Application
Qifeng Yu; Wei Huang; You He, Editor(s)
PDF: 8 pages
Proc. SPIE 11023, Fifth Symposium on Novel Optoelectronic Detection Technology and Application, 1102333 (12 March 2019); doi: 10.1117/12.2521905
Show Author Affiliations
Yuan Wen, Shanghai Institute of Satellite Engineering (China)
Yong Yang, Shanghai Institute of Satellite Engineering (China)
Yun-duan Li, Shanghai Institute of Satellite Engineering (China)
Yong Yang, Shanghai Institute of Satellite Engineering (China)
Yun-duan Li, Shanghai Institute of Satellite Engineering (China)
Yun-zhu Sun, Shanghai Academy of Spaceflight Technology (China)
Guang-wei Jiang, Shanghai Academy of Spaceflight Technology (China)
Guang-wei Jiang, Shanghai Academy of Spaceflight Technology (China)
Published in SPIE Proceedings Vol. 11023:
Fifth Symposium on Novel Optoelectronic Detection Technology and Application
Qifeng Yu; Wei Huang; You He, Editor(s)
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