
Proceedings Paper
Matrix of piezoelectric resonators for registration of spatial distribution of laser radiationFormat | Member Price | Non-Member Price |
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Paper Abstract
A novel method of optical image registration using matrix of piezoelectric crystals is introduced. This technique allows measurement of beam profiles without using attenuation systems even at high power levels of incident radi- ation. Each element of the sensor matrix is the crystal piezoelectric resonator that has its own set of eigenmodes, which frequencies strongly depend on temperature. Due to an inverse piezoelectric effect the eigenmodes can be excited noncontactly via the application of the probe radiofrequency electric field providing that its frequency corresponds to any of the crystal eigenmode frequencies. Due to the residual optical absorption each element is heated in compliance with the incident radiation power. A calibration procedure is preliminary performed by transmitting collimated laser radiation separately through each single matrix element.
Paper Details
Date Published: 11 April 2019
PDF: 6 pages
Proc. SPIE 11028, Optical Sensors 2019, 110282C (11 April 2019); doi: 10.1117/12.2521562
Published in SPIE Proceedings Vol. 11028:
Optical Sensors 2019
Francesco Baldini; Jiri Homola; Robert A. Lieberman, Editor(s)
PDF: 6 pages
Proc. SPIE 11028, Optical Sensors 2019, 110282C (11 April 2019); doi: 10.1117/12.2521562
Show Author Affiliations
Kirill V. Zotov, Moscow Institute of Physics and Technology (Russian Federation)
Timur O. Bazarov, Moscow Institute of Physics and Technology (Russian Federation)
Vladimir V. Fedorov, Moscow Institute of Physics and Technology (Russian Federation)
Ilya A. Savichev, Moscow Institute of Physics and Technology (Russian Federation)
Timur O. Bazarov, Moscow Institute of Physics and Technology (Russian Federation)
Vladimir V. Fedorov, Moscow Institute of Physics and Technology (Russian Federation)
Ilya A. Savichev, Moscow Institute of Physics and Technology (Russian Federation)
Andrey E. Korolkov, Moscow Institute of Physics and Technology (Russian Federation)
Kotelnikov Institute of Radio Engineering and Electronics (Russian Federation)
Denis M. Mukhankov, Kotelnikov Institute of Radio Engineering and Electronics (Russian Federation)
Alexey V. Konyashkin, Moscow Institute of Physics and Technology (Russian Federation)
Kotelnikov Institute of Radio Engineering and Electronics (Russian Federation)
Oleg A. Ryabushkin, Moscow Institute of Physics and Technology (Russian Federation)
Kotelnikov Institute of Radio Engineering and Electronics (Russian Federation)
Kotelnikov Institute of Radio Engineering and Electronics (Russian Federation)
Denis M. Mukhankov, Kotelnikov Institute of Radio Engineering and Electronics (Russian Federation)
Alexey V. Konyashkin, Moscow Institute of Physics and Technology (Russian Federation)
Kotelnikov Institute of Radio Engineering and Electronics (Russian Federation)
Oleg A. Ryabushkin, Moscow Institute of Physics and Technology (Russian Federation)
Kotelnikov Institute of Radio Engineering and Electronics (Russian Federation)
Published in SPIE Proceedings Vol. 11028:
Optical Sensors 2019
Francesco Baldini; Jiri Homola; Robert A. Lieberman, Editor(s)
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