Share Email Print
cover

Proceedings Paper

Broadband antireflection coatings for advanced sensing and imaging applications
Author(s): Gopal G. Pethuraja; Adam W. Sood; John W. Zeller; Roger E. Welser; Ashok K. Sood; Harry Efstathiadis; Priyalal S. Wijewarnasuriya
Format Member Price Non-Member Price
PDF $17.00 $21.00

Paper Abstract

Sensors and imaging systems operating from visible to long-wave infrared (LWIR) spectrum are being developed for a variety of defense and commercial systems applications. Signal losses due to the reflection of incident signal from the surface of sensors and optical components limits the performance of image sensing systems. Antireflection (AR) coating technology overcomes this limitation and enhance the performance of image sensing systems. Magnolia is actively working on the development and advancement of ultra-high-performance AR coatings for a wide variety of defense and commercial applications. Nanostructured AR coatings fabricated via a scalable self-assembly process are shown to enhance the optical transmission through transparent optical components and sensor substrates by minimizing reflection losses in the spectral band of interest to less than one percent, a substantial improvement over conventional thin-film AR coating technology. Step-graded AR structures also exhibit excellent omnidirectional performance and have recently been demonstrated in various IR spectral bands.

Paper Details

Date Published: 13 May 2019
PDF: 11 pages
Proc. SPIE 10980, Image Sensing Technologies: Materials, Devices, Systems, and Applications VI, 109800U (13 May 2019); doi: 10.1117/12.2521463
Show Author Affiliations
Gopal G. Pethuraja, Magnolia Optical Technologies, Inc. (United States)
Adam W. Sood, Magnolia Optical Technologies, Inc. (United States)
John W. Zeller, Magnolia Optical Technologies, Inc. (United States)
Roger E. Welser, Magnolia Optical Technologies, Inc. (United States)
Ashok K. Sood, Magnolia Optical Technologies, Inc. (United States)
Harry Efstathiadis, SUNY Polytechnic Institute (United States)
Priyalal S. Wijewarnasuriya, U.S. Army Research Lab. (United States)


Published in SPIE Proceedings Vol. 10980:
Image Sensing Technologies: Materials, Devices, Systems, and Applications VI
Nibir K. Dhar; Achyut K. Dutta; Sachidananda R. Babu, Editor(s)

© SPIE. Terms of Use
Back to Top
PREMIUM CONTENT
Sign in to read the full article
Create a free SPIE account to get access to
premium articles and original research
Forgot your username?
close_icon_gray