
Proceedings Paper
A 320 x 256 readout circuit with wide dynamic range and high injection efficiencyFormat | Member Price | Non-Member Price |
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Paper Abstract
A 320×256 readout integrated circuit (ROIC) with a pixel pitch of 30μm is presented for solar-blind AlGaN ultraviolet focal array plane (FPA). Capacitor feedback transimpendance amplifier (CTIA) has been selected as the input structure of the ROIC because of its excellent performance. A novel cascade amplifier with a symmetrical differential input stage is designed for input stage of CTIA, and an ultra-low capacitance with a value of 10fF is in the feedback loop of the amplifier as integral capacitor. Furthermore, the ROIC read out in a rolling shutter mode by using cascade D flip-flops. The ROIC has been fabricated 0.35μm 2P4M mixed signal CMOS process and interfaced with AlGaN solar-blind ultraviolet focal array plane (UVFPA). The test result shows that 320×256 AlGaN UVFPA has a wide dynamic range of 88.2dB with 5V power supply and has a high injection efficiency of 98.2%.
Paper Details
Date Published: 12 March 2019
PDF: 7 pages
Proc. SPIE 11023, Fifth Symposium on Novel Optoelectronic Detection Technology and Application, 1102311 (12 March 2019); doi: 10.1117/12.2521209
Published in SPIE Proceedings Vol. 11023:
Fifth Symposium on Novel Optoelectronic Detection Technology and Application
Qifeng Yu; Wei Huang; You He, Editor(s)
PDF: 7 pages
Proc. SPIE 11023, Fifth Symposium on Novel Optoelectronic Detection Technology and Application, 1102311 (12 March 2019); doi: 10.1117/12.2521209
Show Author Affiliations
Ding Ma, Shanghai Institute of Technical Physics (China)
Xiang-yang Li, Shanghai Institute of Technical Physics (China)
Xiang-yang Li, Shanghai Institute of Technical Physics (China)
Yan Zhang, Shanghai Institute of Technical Physics (China)
Fu-hao Liu, Shanghai Institute of Technical Physics (China)
Fu-hao Liu, Shanghai Institute of Technical Physics (China)
Published in SPIE Proceedings Vol. 11023:
Fifth Symposium on Novel Optoelectronic Detection Technology and Application
Qifeng Yu; Wei Huang; You He, Editor(s)
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