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Proceedings Paper

FPGA-based phase measuring profilometry system
Author(s): Albrecht Hess; Christina Junger; Maik Rosenberger; Gunther Notni
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Paper Abstract

This paper proposes an architecture for a phase measuring profilometry system, that can be efficiently implemented on a Xilinx Zynq-7000 SoC. After a brief system overview, the paper starts at the very beginning point of such a task, that is the camera calibration. A calibration procedure using OpenCV functions is outlined and the calculation of compressed rectification maps is described in more detail. The compressed rectification maps are used for lens undistortion and rectification to reduce the memory load. The hardware accelerated part of the system comprises the image acquisition, the lens undistortion and image rectification, the phase accumulation with following phase unwrapping, the phase matching and the 3D reconstruction. For phase unwrapping a multi-frequency approach is used that can be easily implemented on the given architecture. The interfacing of the hardware modules follows a fully pipelined implementation scheme so that the image processing can be done in real time.

Paper Details

Date Published: 14 May 2019
PDF: 8 pages
Proc. SPIE 10997, Three-Dimensional Imaging, Visualization, and Display 2019, 109970O (14 May 2019); doi: 10.1117/12.2520916
Show Author Affiliations
Albrecht Hess, Technische Univ. Ilmenau (Germany)
Christina Junger, Technische Univ. Ilmenau (Germany)
Maik Rosenberger, Technische Univ. Ilmenau (Germany)
Gunther Notni, Technische Univ. Ilmenau (Germany)
Fraunhofer Institute for Applied Optics and Precision Engineering (Germany)

Published in SPIE Proceedings Vol. 10997:
Three-Dimensional Imaging, Visualization, and Display 2019
Bahram Javidi; Jung-Young Son; Osamu Matoba, Editor(s)

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