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Proceedings Paper

Terahertz quantitative metrology using 300 GHz in-line digital holography
Author(s): Min Wan; Hui Yuan; Dovilė Čibiraitė; Derek Cassidy; Alvydas Lisauskas; John J. Healy; Hartmut G. Roskos; Viktor Krozer; John T. Sheridan
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Paper Abstract

Continuous-wave THz digital holography (DH) is an advanced interference imaging technique, which can be used to reconstruct the amplitude and phase distributions of a sample. In this paper, an in-line holographic system is presented using a 300 GHz source and a highly sensitive broadband CMOS TeraFET (THz Field-Effect Transistor) detector. Numerical reconstruction is achieved using the angular spectrum approach. Experimental results are presented for a sample made of Polyvinyl Chloride (PVC). The results demonstrate that THz digital holography can be readily applied to perform quantitative metrology and may find many applications in 3D digital imaging and microscopy.

Paper Details

Date Published: 23 April 2019
PDF: 7 pages
Proc. SPIE 11030, Holography: Advances and Modern Trends VI, 110300R (23 April 2019); doi: 10.1117/12.2520787
Show Author Affiliations
Min Wan, Univ. College Dublin (Ireland)
Hui Yuan, Goethe-Univ. Frankfurt am Main (Germany)
Dovilė Čibiraitė, Goethe-Univ. Frankfurt am Main (Germany)
Derek Cassidy, Univ. College Dublin (Ireland)
Alvydas Lisauskas, Vilnius Univ. (Lithuania)
John J. Healy, Univ. College Dublin (Ireland)
Hartmut G. Roskos, Goethe-Univ. Frankfurt am Main (Germany)
Viktor Krozer, Goethe-Univ. Frankfurt am Main (Germany)
John T. Sheridan, Univ. College Dublin (Ireland)

Published in SPIE Proceedings Vol. 11030:
Holography: Advances and Modern Trends VI
Antonio Fimia; Miroslav Hrabovský; John T. Sheridan, Editor(s)

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