Share Email Print

Proceedings Paper

Evaluation of technologies for autonomous visual inspection of additive manufacturing (AM)
Author(s): Greg A. Finney; Christopher M. Persons; Jacob R. Whitten; Allison A. Centamore; Caleb P. M. Trevithick
Format Member Price Non-Member Price
PDF $17.00 $21.00

Paper Abstract

IERUS Technologies, under subcontract to Tethers Unlimited, is developing a machine vision inspection system for the validation of metallic components additively manufactured in space. The effort has begun with a survey of vision technologies, including stereo vision, structure from motion, light field imaging, and structured illumination. Using the optical data, 3D point clouds will be registered as the object is viewed from multiple orientations. From the point cloud data, a mix of deterministic and machine learning algorithms will be used to identify geometric primitives that can be compared to those included in the computer aided design model. In addition, the system will estimate the surface roughness. Based upon the tolerances required within the CAD, pass/fail criteria will be established and the system will determine if the part passes, fails, or cannot be determined. At the end of the current phase, IERUS will perform a demonstration using a prototype system on a challenge artifact provided by NASA.

Paper Details

Date Published: 13 May 2019
PDF: 12 pages
Proc. SPIE 10991, Dimensional Optical Metrology and Inspection for Practical Applications VIII, 109910U (13 May 2019); doi: 10.1117/12.2520279
Show Author Affiliations
Greg A. Finney, IERUS Technologies, Inc. (United States)
Christopher M. Persons, IERUS Technologies, Inc. (United States)
Jacob R. Whitten, IERUS Technologies, Inc. (United States)
Allison A. Centamore, IERUS Technologies, Inc. (United States)
Caleb P. M. Trevithick, IERUS Technologies, Inc. (United States)

Published in SPIE Proceedings Vol. 10991:
Dimensional Optical Metrology and Inspection for Practical Applications VIII
Kevin G. Harding; Song Zhang, Editor(s)

© SPIE. Terms of Use
Back to Top
Sign in to read the full article
Create a free SPIE account to get access to
premium articles and original research
Forgot your username?