Share Email Print
cover

Proceedings Paper

Peak power measurement of nanoscale short-pulse laser
Author(s): Yan Sun; Jiaxin Li; Min Huang; Zhanchao Wang
Format Member Price Non-Member Price
PDF $17.00 $21.00

Paper Abstract

Limited by the volume and power of lasers, nanosecond short-pulse lasers are commonly used in laser communication, laser range finder, laser guidance, pulse laser Radar, high-speed photography and 3D imaging systems. Therefore, as one of the key laser indicators, the nanosecond short-pulse laser peak power measurement is essential. In this paper, a new method for measuring peak power of nanosecond short-pulse laser is proposed. The peak power can be measured directly by extending the pulse width without using super high speed ADC chip. Research is made from two parts: detector and control host. As for the detector, a new attenuation unit is designed, which can well suppress the peak power decrease caused by the traditional detector broadening the short pulse and realize the original waveform output (non-distortion). In the control host, a new pulse broadening circuit is proposed, which realized the peak signal acquisition of 20ns pulse width (5ns rising edge) laser without the use of ultra-high speed ADC acquisition chip. The measurement system can achieve technical indicators as follows: the measurable pulse width is 20ns~150us, Pulse rising edge is 5ns~10us, the repetition frequency is 100Hz~500kHz, and the measurement range of laser peak power is 1W~500W.

Paper Details

Date Published: 26 April 2019
PDF: 7 pages
Proc. SPIE 11034, Short-pulse High-energy Lasers and Ultrafast Optical Technologies, 110340Q (26 April 2019); doi: 10.1117/12.2520134
Show Author Affiliations
Yan Sun, Academy of Opto-Electronics (China)
Jiaxin Li, Beijing Institute of Opto-Electronic Technology (China)
Min Huang, Academy of Opto-Electronics (China)
Univ. of Chinese Academy of Sciences (China)
Zhanchao Wang, Academy of Opto-Electronics (China)


Published in SPIE Proceedings Vol. 11034:
Short-pulse High-energy Lasers and Ultrafast Optical Technologies
Pavel Bakule; Constantin L. Haefner, Editor(s)

© SPIE. Terms of Use
Back to Top