Proceedings Paper
An over-top tracking test system for electro-optical detection device| Format | Member Price | Non-Member Price |
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Paper Abstract
In this paper, an over-top tracking test system for electro-optical detection device is designed, which provides an overtop test environment for electro-optical detection device by using a two-dimensional motion turntable covering the target source of the infrared and visible light bands in a rolling and pitching shafting system. The electro-optical detection device for two-frame configuration provides over-top tracking[1] function and performance testing and verification conditions.
Paper Details
Date Published: 12 March 2019
PDF: 5 pages
Proc. SPIE 11023, Fifth Symposium on Novel Optoelectronic Detection Technology and Application, 110230J (12 March 2019); doi: 10.1117/12.2520132
Published in SPIE Proceedings Vol. 11023:
Fifth Symposium on Novel Optoelectronic Detection Technology and Application
Qifeng Yu; Wei Huang; You He, Editor(s)
PDF: 5 pages
Proc. SPIE 11023, Fifth Symposium on Novel Optoelectronic Detection Technology and Application, 110230J (12 March 2019); doi: 10.1117/12.2520132
Show Author Affiliations
Shaofei Wang, Science and Technology on Electro-Optic Control Lab. (China)
Electro-Optical Equipment Research Institute (China)
Fei Xie, Science and Technology on Electro-Optic Control Lab. (China)
Electric-Optical Equipment Research Institute (China)
Electro-Optical Equipment Research Institute (China)
Fei Xie, Science and Technology on Electro-Optic Control Lab. (China)
Electric-Optical Equipment Research Institute (China)
Dezhao Zhou, Science and Technology on Electro-Optic Control Lab. (China)
Electric-Optical Equipment Research Institute (China)
Baolin Du, Science and Technology on Electro-Optic Control Lab. (China)
Electric-Optical Equipment Research Institute (China)
Electric-Optical Equipment Research Institute (China)
Baolin Du, Science and Technology on Electro-Optic Control Lab. (China)
Electric-Optical Equipment Research Institute (China)
Published in SPIE Proceedings Vol. 11023:
Fifth Symposium on Novel Optoelectronic Detection Technology and Application
Qifeng Yu; Wei Huang; You He, Editor(s)
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