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Proceedings Paper

Optical property study of phase change optical recording thin film media
Author(s): Yanwu Lu; Ailun Rong
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Paper Abstract

Room temperature reflectivity measurement over the energy 0.7eV to 7eV has been made on the phase change recording thin film based on Ge-Sb-Te alloy. The reflectivity curves have been obtained by spectrophotometer. An analysis of reflectivity curves for this recording medium has been made by use of Kramers-Kronig (KK) relation. The refraction index n($omaga) have been obtained as a n energy function. The optical gaps of the recording medium are 0.71eV in glassy state and 1.32eV in crystalline state. The research results show that this recording medium can be used as a phase change optical storage material in short wavelength range. This paper provides a research method by use of KK relation to obtain optical properties of recording thin film, and gives a practical application of this phase change recording medium in short wavelength range and high density storage.

Paper Details

Date Published: 20 September 1996
PDF: 6 pages
Proc. SPIE 2890, Optical Recording, Storage, and Retrieval Systems, (20 September 1996); doi: 10.1117/12.251986
Show Author Affiliations
Yanwu Lu, Beijing Univ. of Aeronautics and Astronautics (China)
Ailun Rong, Beijing Univ. of Aeronautics and Astronautics (China)

Published in SPIE Proceedings Vol. 2890:
Optical Recording, Storage, and Retrieval Systems
Baogen Feng; Yoshito Tsunoda, Editor(s)

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