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Proceedings Paper

Effective atomic number and electron density determination using spectral x-ray CT
Author(s): Matteo Busi; Jan Kehres; Mohamad Khalil; Ulrik Lund Olsen
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Paper Abstract

We present Spectral X-ray Computed Tomography (SCT) estimations of material properties directly from energy-dependent measurements of linear attenuation coefficients (LAC). X-ray Computed Tomography (CT) is commonly utilized to characterize the internal properties of an object of interest. Dual-Energy X-ray CT allows material characterization into energy-independent physical properties such as Ze and electron density ρe. However, it is not robust in presence of dense materials and metal artifacts. We report on the performance of a method for system-independent characterization of materials that introduces a spectroscopic detector into X-ray CT, called spectral ρe/Ze estimation (SRZE). We benchmark the SRZE method against energy-integrated measurements in material classification tests, finding superior accuracy in the predictions. The advantage of this technique, over other methods for material characterization using x-ray CT, is that it does not require a set of reference materials for calibration. Moreover, the simultaneous detection of spectral features makes it robust to highly attenuating materials, since the energy intervals for which the attenuation is photon limited can easily be detected and excluded from the feature estimation.

Paper Details

Date Published: 14 May 2019
PDF: 11 pages
Proc. SPIE 10999, Anomaly Detection and Imaging with X-Rays (ADIX) IV, 1099903 (14 May 2019); doi: 10.1117/12.2519851
Show Author Affiliations
Matteo Busi, Technical Univ. of Denmark (Denmark)
Jan Kehres, Technical University of Denmark (Denmark)
Mohamad Khalil, Technical Univ. of Denmark (Denmark)
Ulrik Lund Olsen, Technical Univ. of Denmark (Denmark)


Published in SPIE Proceedings Vol. 10999:
Anomaly Detection and Imaging with X-Rays (ADIX) IV
Amit Ashok; Joel A. Greenberg; Michael E. Gehm, Editor(s)

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