Share Email Print

Proceedings Paper

Operation conditions and considerations of single photon avalanche photodiode for optical wireless communication
Format Member Price Non-Member Price
PDF $17.00 $21.00

Paper Abstract

In order to detect weak light in telecommunication wavelength, InGaAs/InP single-photon avalanche diode (SPAD) is receiving increasing interest. The operation conditions which contains excess bias and operating temperature will effectively influence the performance of SPAD. After analyzing the structure of SPAD, the integrated model of intrinsic parameters of SPAD including photon detection efficiency (PDE) and dark count rate (DCR) is built, which is based on the excess bias and operating temperature. Moreover, the integrated model is compared with the measured data, and it is verified to be able to predict the PDE and DCR accurately. Then, combining with the bit error rate (BER) model of photon-counting based optical wireless communication, the optimal operation conditions of SPAD are investigated. The simulation results show that with the increasing of excess bias from 0-V to 10-V, BER can be effectively reduced. And keeping the excess bias at 5-V can make the BER reach its bottom, when excess bias is limited by the gating circuits of f5-V. In addition, cooling the SPAD to operate at around 245-K could let the system work at the optimal BER.

Paper Details

Date Published: 14 February 2019
PDF: 9 pages
Proc. SPIE 11048, 17th International Conference on Optical Communications and Networks (ICOCN2018), 110480W (14 February 2019); doi: 10.1117/12.2519588
Show Author Affiliations
Chen Wang, Army Engineering Univ. (China)
Jingyuan Wang, Army Engineering Univ. (China)
Zhiyong Xu, Army Engineering Univ. (China)
Jianhua Li, Army Engineering Univ. (China)
Jiyong Zhao, Army Engineering Univ. (China)
Rong Wang, National Univ. of Defense Technology (China)

Published in SPIE Proceedings Vol. 11048:
17th International Conference on Optical Communications and Networks (ICOCN2018)
Zhaohui Li, Editor(s)

© SPIE. Terms of Use
Back to Top
Sign in to read the full article
Create a free SPIE account to get access to
premium articles and original research
Forgot your username?