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Proceedings Paper

Angle dependent scatter in CVD ZnSe and single crystal CaF2 from the infrared through the NIR
Author(s): M. B. Airola; M. E. Thomas; J. Ma; D. V. Hahn; K. Hibbitts; D. Blaney
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Paper Abstract

The data reported in journals on angle resolved scatter measurements for highly transparent window materials is scarce. An experimental facility with enough sensitivity to measure such low level scatter is described. A dynamic range of at least eight orders of magnitude is required to measure the peak of the specular component down to the random diffuse component far removed from the specular direction. Single crystal CaF2 and polycrystalline CVD ZnSe are measured at wavelengths from the visible to the midwave infrared. The use of thick and thin samples allows the distinction between surface scatterance and bulk scatter.

Paper Details

Date Published: 13 May 2019
PDF: 7 pages
Proc. SPIE 10985, Window and Dome Technologies and Materials XVI, 1098504 (13 May 2019); doi: 10.1117/12.2519457
Show Author Affiliations
M. B. Airola, Johns Hopkins Univ. Applied Physics Lab., LLC (United States)
M. E. Thomas, Johns Hopkins Univ. Applied Physics Lab., LLC (United States)
Johns Hopkins Univ. (United States)
J. Ma, Johns Hopkins Univ. (United States)
D. V. Hahn, Johns Hopkins Univ. Applied Physics Lab., LLC (United States)
K. Hibbitts, Johns Hopkins Univ. Applied Physics Lab., LLC (United States)
D. Blaney, Jet Propulsion Lab. (United States)


Published in SPIE Proceedings Vol. 10985:
Window and Dome Technologies and Materials XVI
W. Howard Poisl, Editor(s)

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