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Proceedings Paper

Laser damage testing of windows with anti-reflection structured surfaces for high power continuous-wave near-infrared laser applications
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Paper Abstract

High power continuous-wave (CW) and high pulse energy laser optical systems can suffer damage from untreated optics due to undesirable Fresnel reflections. With high energy pulse lasers, traditional anti-reflection (AR) thin-film coated optics are susceptible to localized field enhancement regions, due to multiple boundaries, and experience laser induced damage on both entry and exit interfaces. Sub-wavelength anti-reflective structured surfaces (ARSS) have been shown to have a higher laser-induced damage threshold than traditional AR coatings. Previously published work detailed nanosecond-pulsed laser-induced damage on planar fused silica (FS) substrates with random ARSS (rARSS) treatment (λ=1064 nm). This study details and compares laser damage and fatigue testing of rARSS treated FS via continuous-wave, 2 kW irradiation (λ=1075 nm). Gaussian laser output was focused to ~ 60-μm-diameter (1/e2), to increase incident intensity, yielding a maximum power density of ~ 70.7 MW/cm2. Laser power and duration were controlled while monitoring the window’s optical transmission and entry/exit surface temperatures. CW durations at maximum power up to 5 min were used. Peak temperatures were recorded for untreated FS, as well as double side treated rARSS samples.

Paper Details

Date Published: 17 May 2019
PDF: 6 pages
Proc. SPIE 10985, Window and Dome Technologies and Materials XVI, 109850D (17 May 2019); doi: 10.1117/12.2519194
Show Author Affiliations
Christopher R. Wilson, The Univ. of North Carolina at Charlotte (United States)
Thomas C. Hutchens, The Univ. of North Carolina at Charlotte (United States)
Jesse A. Frantz, U.S. Naval Research Lab. (United States)
Lynda E. Busse, U.S. Naval Research Lab. (United States)
L. Brandon Shaw, U.S. Naval Research Lab. (United States)
Jas S. Sanghera, U.S. Naval Research Lab. (United States)
Ishwar D. Aggarwal, The Univ. of North Carolina at Charlotte (United States)
KeyW Corp. (United States)


Published in SPIE Proceedings Vol. 10985:
Window and Dome Technologies and Materials XVI
W. Howard Poisl, Editor(s)

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