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Proceedings Paper

Testing active polarimetric imagers in fog (Conference Presentation)
Author(s): John D. van der Laan; Brian J. Redman; Jacob W. Segal; Karl Westlake; Jeremy B. Wright

Paper Abstract

Heavy fogs and other highly scattering environments pose a challenge for many commercial and national security sensing systems. Current autonomous systems rely on a range of optical sensors for guidance and remote sensing that can be degraded by highly scattering environments. In our previous and on-going simulation work, we have shown polarized light can increase signal or range through a scattering environment such as fog. Specifically, we have shown circularly polarized light maintains its polarized signal through a larger number of scattering events and thus range, better than linearly polarized light. In this work we present design and testing results of active polarization imagers at short-wave infrared and visible wavelengths. We explore multiple polarimetric configurations for the imager, focusing on linear and circular polarization states. Testing of the imager was performed in the Sandia Fog Facility. The Sandia Fog Facility is a 180 ft. by 10 ft. chamber that can create fog-like conditions for optical testing. This facility offers a repeatable fog scattering environment ideally suited to test the imager’s performance in fog conditions. We show that circular polarized imagers can penetrate fog better than linear polarized imagers.

Paper Details

Date Published: 14 May 2019
Proc. SPIE 11019, Situation Awareness in Degraded Environments 2019, 1101909 (14 May 2019); doi: 10.1117/12.2519122
Show Author Affiliations
John D. van der Laan, Sandia National Labs. (United States)
Brian J. Redman, Sandia National Labs. (United States)
Jacob W. Segal, Sandia National Labs. (United States)
Karl Westlake, Sandia National Labs. (United States)
Jeremy B. Wright, Sandia National Labs. (United States)

Published in SPIE Proceedings Vol. 11019:
Situation Awareness in Degraded Environments 2019
John (Jack) N. Sanders-Reed; Jarvis (Trey) J. Arthur III, Editor(s)

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