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Proceedings Paper

Food safety and quality applications of line-scan Raman imaging and spectroscopy techniques (Conference Presentation)

Paper Abstract

Commercial Raman systems generally conduct imaging and spectroscopy measurements at subcentimeter scales. Such small spatial ranges cannot be used to inspect food samples with large surface areas (e.g., tomato fruit and beef steak), which is not convenient for food experiments. A line-scan macro-scale Raman system has been developed using a 785 nm line laser to implement high-throughput Raman chemical imaging (RCI) for food safety and quality research. A one-axis positioning table is used to move the samples to accumulate hyperspectral data using a pushbroom method. A dispersive Raman spectrograph is used in the system, which can be configured to backscattering RCI mode for surface inspection and spatially offset Raman spectroscopy (SORS) mode for subsurface inspection. In-house developed LabVIEW software is used to fulfill functions for system control, hardware parameterization, and data transfer. The systems is flexible and versatile for food test, and it has been used to evaluate safety and quality of various food and agricultural products, such as detecting chemical adulterants mixed in food powders, mapping carotenoid content on carrot cross section, imaging whole surface of pork shoulder, and authenticating foods and ingredients through packages.

Paper Details

Date Published: 14 May 2019
PDF
Proc. SPIE 11016, Sensing for Agriculture and Food Quality and Safety XI, 1101604 (14 May 2019); doi: 10.1117/12.2519083
Show Author Affiliations
Jianwei Qin, Agricultural Research Service (United States)
Moon S. Kim, Agricultural Research Service (United States)
Kuanglin Chao, Agricultural Research Service (United States)
Jeehwa Hong, Agricultural Research Service (United States)
Insuck Baek, Agricultural Research Service (United States)
Sagar Dhakal, Agricultural Research Service (United States)
Byoung-Kwan Cho, Chungnam National Univ. (Korea, Republic of)


Published in SPIE Proceedings Vol. 11016:
Sensing for Agriculture and Food Quality and Safety XI
Moon S. Kim; Bryan A. Chin; Byoung-Kwan Cho, Editor(s)

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