
Proceedings Paper
Learning models for acquisition planning of CT projections (Conference Presentation)
Paper Abstract
Task-specific adaptive sensing in computed tomography (CT) scan is critical to dose reduction and scanning acceleration. Due to the sequential nature of the CT acquisition process, the information of the objects aggregates as the measurement process progresses. Conventional adaptive sensing methods, aiming to maximize the task-specific information acquisition, formulate the measurement strategy as an optimization problem with assumptions in object distributions (for example, Gaussian mixture model), which requires considerable computational time and resource during the acquisition. In our work, we propose a machine learning approach to learn task-specific data-acquisition policy, with the only assumption on the locality and composition of the objects, which shifts the computation load to the pre-acquisition stage. We analyze our learned method on public dataset comparing to a stochastic policy which plans the acquisition randomly and a uniform policy which plans the acquisition with a fixed interval. Based on our experiments the learned method requires at least 25% fewer acquisition steps than the stochastic and uniform policies.
Paper Details
Date Published: 14 May 2019
PDF
Proc. SPIE 10999, Anomaly Detection and Imaging with X-Rays (ADIX) IV, 109990C (14 May 2019); doi: 10.1117/12.2519008
Published in SPIE Proceedings Vol. 10999:
Anomaly Detection and Imaging with X-Rays (ADIX) IV
Amit Ashok; Joel A. Greenberg; Michael E. Gehm, Editor(s)
Proc. SPIE 10999, Anomaly Detection and Imaging with X-Rays (ADIX) IV, 109990C (14 May 2019); doi: 10.1117/12.2519008
Show Author Affiliations
Yangyang Sun, CREOL, The College of Optics and Photonics, Univ. of Central Florida (United States)
Zheyuan Zhu, CREOL, The College of Optics and Photonics, Univ. of Central Florida (United States)
Zheyuan Zhu, CREOL, The College of Optics and Photonics, Univ. of Central Florida (United States)
Shuo Pang, CREOL, The College of Optics and Photonics, Univ. of Central Florida (United States)
Published in SPIE Proceedings Vol. 10999:
Anomaly Detection and Imaging with X-Rays (ADIX) IV
Amit Ashok; Joel A. Greenberg; Michael E. Gehm, Editor(s)
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