
Proceedings Paper
Introducing a general purpose S/W for IR image generation and analysisFormat | Member Price | Non-Member Price |
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Paper Abstract
Recent guided missiles equipped with the IR sensor system detect or identify target objects by using the infrared signal contrast between the object and the background within the infrared image obtained from the IR sensor. In either situations requiring for high detectability or requiring for low observability, it is important to obtain information about infrared signatures of the object under various environmental conditions prior to the applications. Infrared signal analyses can be performed in two different ways either by direct measurements or by computer simulations. However the methods by direct measurements can be a costly or unavailable way when the object is located on a hardly reachable area under various environmental conditions while a computer simulation software can be a versatile and useful tool in analyzing IR signals from the object under those harsh situations. Demands for versatile infrared signature simulation tools have been a recent upsurge over many countries for military or commercial applications. In this study, we are introducing a general purpose simulation software developed for IR image generation and analysis. The software is developed for unsteady state thermal analyses of 3-D objects constructed by using different materials coated with various paints under varying environmental conditions. Also the software has the capabilities of analyzing the CRI, the detection probability and the detection range information from the images generated.
Paper Details
Date Published: 14 May 2019
PDF: 7 pages
Proc. SPIE 11001, Infrared Imaging Systems: Design, Analysis, Modeling, and Testing XXX, 110011B (14 May 2019); doi: 10.1117/12.2518886
Published in SPIE Proceedings Vol. 11001:
Infrared Imaging Systems: Design, Analysis, Modeling, and Testing XXX
Gerald C. Holst; Keith A. Krapels, Editor(s)
PDF: 7 pages
Proc. SPIE 11001, Infrared Imaging Systems: Design, Analysis, Modeling, and Testing XXX, 110011B (14 May 2019); doi: 10.1117/12.2518886
Show Author Affiliations
Jun-Hyuk Choi, Chung-Ang Univ. (Korea, Republic of)
Chang-Won Kim, Chung-Ang Univ. (Korea, Republic of)
Chang-Won Kim, Chung-Ang Univ. (Korea, Republic of)
Published in SPIE Proceedings Vol. 11001:
Infrared Imaging Systems: Design, Analysis, Modeling, and Testing XXX
Gerald C. Holst; Keith A. Krapels, Editor(s)
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