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Proceedings Paper

Design of polarized light interference microscopy
Author(s): Haiwu Yu; Shao-Xian Meng
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Paper Abstract

A novel equivalent optical path polarized light interference microscopy has been designed which provides two attractive properties of the perfect bright-field background techniques. This microscopy is suitable for detecting the phase objects and microdamage spots or inclusions in the transparent optical materials.

Paper Details

Date Published: 23 September 1996
PDF: 4 pages
Proc. SPIE 2885, Holographic Optical Elements and Displays, (23 September 1996); doi: 10.1117/12.251858
Show Author Affiliations
Haiwu Yu, China Academy of Engineering Physics (China)
Shao-Xian Meng, Shanghai Institute of Optics and Fine Mechanics (China)

Published in SPIE Proceedings Vol. 2885:
Holographic Optical Elements and Displays
Freddie Shing-Hong Lin; Daxiong Xu, Editor(s)

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