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Proceedings Paper

Sparse-sampling methods for hyperspectral infrared microscopy
Author(s): Andreas C. Geiger; James R. W. Ulcickas; Youlin Liu; Mark F. Witinski; Romain Blanchard; Garth J. Simpson
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Paper Abstract

A hyperspectral beam-scanning microscope operating in the long wave infrared (LWIR) is demonstrated for future application to stand-off imaging platforms. A 32-channel quantum-cascade laser (QCL) array enables rapid wavelength modulation for fast hyperspectral imaging through sparse sampling in position and wavelength, which when coupled with image reconstruction techniques can enhance frame rate. Initial measurements of dichloromethane and water mixtures are shown, utilizing spectral information for classification across the field of view. Ongoing efforts aim to utilize copropagating visible and IR beams to enhance spatial resolution for the IR measurements by combining spatial information retrieved from visible images obtained concurrently. Future work will leverage Lissajous trajectories for sparsely-sampled beam-scanning and extend the image interpolation algorithms to arbitrary dimension for sparse sampling in the spectral domain. Simulations of the error associated with various sparse-sampling methods are also presented herein which support the use of Lissajous trajectories as a sparse-sampling method in beam-scanning microscopy.

Paper Details

Date Published: 13 May 2019
PDF: 7 pages
Proc. SPIE 10980, Image Sensing Technologies: Materials, Devices, Systems, and Applications VI, 1098016 (13 May 2019); doi: 10.1117/12.2518471
Show Author Affiliations
Andreas C. Geiger, Purdue Univ. (United States)
James R. W. Ulcickas, Purdue Univ. (United States)
Youlin Liu, Purdue Univ. (United States)
Mark F. Witinski, Pendar Technologies (United States)
Romain Blanchard, Pendar Technologies (United States)
Garth J. Simpson, Purdue Univ. (United States)


Published in SPIE Proceedings Vol. 10980:
Image Sensing Technologies: Materials, Devices, Systems, and Applications VI
Nibir K. Dhar; Achyut K. Dutta; Sachidananda R. Babu, Editor(s)

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