Share Email Print
cover

Proceedings Paper

Methods for addressing multiple reflections in a structured light profiler
Author(s): Kevin Harding
Format Member Price Non-Member Price
PDF $17.00 $21.00

Paper Abstract

Structured light, using either laser lines or projected patterns, have gained wide use in the profiling parts from extruded parts of complex assemblies. A line of light is projected from one angle and viewed from another angle to provide a view of the profile of the surface using the principles of triangulation. There can be many sources of noise in these systems such as speckle or surface texture which have been addressed by numerous methods. One of the more difficult challenges often encountered with structured light systems is the presence of reflection of the line of light that are not as expected or wanted. These outlier reflections may be due to multiple reflections from one surface to another or in the case of transparent surfaces, from other surfaces behind the surface being contoured. This paper will discuss these challenges and the commonly used assumptions that may not be sufficient to sort out the right light profile, then present several new methods that allow the separation of the desired profile data from the noise.

Paper Details

Date Published: 13 May 2019
PDF: 9 pages
Proc. SPIE 10991, Dimensional Optical Metrology and Inspection for Practical Applications VIII, 109910L (13 May 2019); doi: 10.1117/12.2518261
Show Author Affiliations
Kevin Harding, Optical Metrology Solutions (United States)


Published in SPIE Proceedings Vol. 10991:
Dimensional Optical Metrology and Inspection for Practical Applications VIII
Kevin G. Harding; Song Zhang, Editor(s)

© SPIE. Terms of Use
Back to Top
PREMIUM CONTENT
Sign in to read the full article
Create a free SPIE account to get access to
premium articles and original research
Forgot your username?
close_icon_gray