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Proceedings Paper

NEXAFS spectroscopy and spectromicroscopy with laser-produced plasma sources of soft x-ray radiation
Author(s): P. Wachulak; M. Duda; A. Bartnik; A. Sarzyński; Ł. Węgrzyński; T. Fok; H. Fiedorowicz
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Paper Abstract

In this work, a near edge X-ray fine structure spectroscopy (NEXAFS) based on a laser-plasma compact soft X-ray (SXR) source is presented. The NEXAFS spectrum was acquired simultaneously for all energies near the absorption edge, using a broadband emission from krypton plasma, in contrary to the existing, synchrotron-based spectroscopic systems. In such SXR source, a plasma is produced by an interaction of a laser beam with a double stream gas puff target. The plasma efficiently emits SXR radiation from 2-5 nm wavelength (250-620 eV photon energy). Such broadband emission allows acquiring simultaneously a sample and a reference spectra, to obtain optical density spectrum of the sample near C-Kα absorption edge, due to a special construction of the SXR spectrometer. The NEXAFS spectra were obtained using PET polymer test sample, from both, the large area and spatially localized to ~30×30 μm2 area. The spatially localized spectra were used to construct 2-D spectromicroscopic maps of sample constituents. Single-shot spectra were also acquired with laser pulse energies of ~10 times larger than in the case of multiple exposures. A short overview of those NEXAFS experiments will be presented.

Paper Details

Date Published: 4 December 2018
PDF: 6 pages
Proc. SPIE 10974, Laser Technology 2018: Progress and Applications of Lasers, 1097412 (4 December 2018); doi: 10.1117/12.2518237
Show Author Affiliations
P. Wachulak, Wojskowa Akademia Techniczna (Poland)
M. Duda, Czech Technical Univ. in Prague (Czech Republic)
A. Bartnik, Wojskowa Akademia Techniczna (Poland)
A. Sarzyński, Wojskowa Akademia Techniczna (Poland)
Ł. Węgrzyński, Wojskowa Akademia Techniczna (Poland)
T. Fok, Wojskowa Akademia Techniczna (Poland)
H. Fiedorowicz, Wojskowa Akademia Techniczna (Poland)

Published in SPIE Proceedings Vol. 10974:
Laser Technology 2018: Progress and Applications of Lasers
Jan K. Jabczynski; Ryszard S. Romaniuk, Editor(s)

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