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Proceedings Paper

Sources of errors in structured light 3D scanners
Author(s): Prem Rachakonda; Bala Muralikrishnan; Daniel Sawyer
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Paper Abstract

Structured light scanners have been commercially available for over a decade and some commercial scanners are evaluated using one of two German guidelines – VDI/VDE 2634 parts 2 and/or 3. Several other research groups have developed physical artifacts that are agnostic to instrument construction and are purpose driven. The use of such guidelines and artifacts is not well understood for instruments which have a variety of sensor configurations and capabilities. It is also not clear if these guidelines/artifacts are sensitive to all the sources of errors that are present in these systems. In this context, this paper will describe the ongoing activities at NIST to study various sources of errors in structured light scanners with an objective of characterizing their performance.

Paper Details

Date Published: 13 May 2019
PDF: 13 pages
Proc. SPIE 10991, Dimensional Optical Metrology and Inspection for Practical Applications VIII, 1099106 (13 May 2019); doi: 10.1117/12.2518126
Show Author Affiliations
Prem Rachakonda, National Institute of Standards and Technology (United States)
Bala Muralikrishnan, National Institute of Standards and Technology (United States)
Daniel Sawyer, National Institute of Standards and Technology (United States)


Published in SPIE Proceedings Vol. 10991:
Dimensional Optical Metrology and Inspection for Practical Applications VIII
Kevin G. Harding; Song Zhang, Editor(s)

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