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Proceedings Paper

Sunburn study of VOx microbolometers
Author(s): Elad Gross; Asaf David
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Paper Abstract

Sunburn is a phenomenon which occurs when pixels are damaged, either temporarily or permanently, as a result of direct exposure to sun radiation. Consequently the image exhibits artifacts seen as white or black spots. In this study we investigate the effect of the F/# on sunburn in VOx bolometer. The experimental setup was designed to simulate sun radiation at flight conditions. We study the sunburn intensity, its recovery time and its dependence on F/#. As part of the data analysis, we used a SNR model to characterize the sunburn intensities. A good correlation was found between the SNR model and the naked eye observation of the sunburn spots.

Paper Details

Date Published: 14 May 2019
PDF: 11 pages
Proc. SPIE 11001, Infrared Imaging Systems: Design, Analysis, Modeling, and Testing XXX, 1100106 (14 May 2019); doi: 10.1117/12.2518089
Show Author Affiliations
Elad Gross, Elbit Systems Ltd. (Israel)
Asaf David, Elbit Systems Ltd. (Israel)

Published in SPIE Proceedings Vol. 11001:
Infrared Imaging Systems: Design, Analysis, Modeling, and Testing XXX
Gerald C. Holst; Keith A. Krapels, Editor(s)

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