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Proceedings Paper

A wavelength interrogator employing tapered hollow waveguides and a low-cost silicon board camera
Author(s): Timothy R. Harrison; Graham J. Hornig; Jorge Marin; Lintong Bu; Seyed Azmayesh-Fard; Duncan G. Elliott; Raymond G. DeCorby
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Paper Abstract

We report on a multi-channel wavelength interrogator for the 850 nm wavelength region, constructed by coupling an integrated array of multi-mode, tapered hollow waveguides to a low-cost silicon-based image sensor. The waveguides are clad by omnidirectional Bragg reflectors, such that guided light is radiated in an out-of-plane direction near and at cutoff. Wavelength shifts were extracted using a simple centroid detection algorithm applied to the terminal cutoff point. This concept combines the small size of a Fabry Perot filter with the dispersive property of a diffraction grating. By imaging multiple tapered waveguides onto a single image sensor with each waveguide coupled to a different fiber, simultaneous extraction of wavelength shifts from several wavelength-multiplexed sensors can be achieved in a very compact package. The prototype described provides resolution on the order of 5 pm and can accommodate ~ 20 sensors spaced by 5 nm on each of the 4 fiber input channels. Enhanced capacity and performance are anticipated through future improvements in waveguide materials and the use of more advanced image processing algorithms.

Paper Details

Date Published: 13 May 2019
PDF: 8 pages
Proc. SPIE 10983, Next-Generation Spectroscopic Technologies XII, 109830B (13 May 2019); doi: 10.1117/12.2517938
Show Author Affiliations
Timothy R. Harrison, Univ. of Alberta (Canada)
Graham J. Hornig, Univ. of Alberta (Canada)
Jorge Marin, Univ. of Alberta (Canada)
Lintong Bu, Univ. of Alberta (Canada)
Seyed Azmayesh-Fard, Univ. of Alberta (Canada)
Duncan G. Elliott, Univ. of Alberta (Canada)
Raymond G. DeCorby, Univ. of Alberta (Canada)

Published in SPIE Proceedings Vol. 10983:
Next-Generation Spectroscopic Technologies XII
Richard A. Crocombe; Luisa T.M. Profeta; Abul K. Azad, Editor(s)

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