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Proceedings Paper

High-precision temperature control scheme and verification for space-borne infrared detectors
Author(s): Shuang-shuang Zhu; Peng Zou; Mao-xin Song; Kai-xuan Zhao; Ming-chun Ling; Zhen-hai Liu; Zhen-wei Qiu; Jin Hong
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Paper Abstract

In order to meet the application requirements of a space borne polarizing radiometer infrared band, a high-precision on-orbit temperature control scheme for the infrared detector combining active temperature control and passive temperature control is proposed. The infrared detector is installed on the heat sink copper block, and the temperature of heat sink copper block is controlled at -20°C~-30°C through the method of auxiliary cold plate + heat pipe thermal conduction. Combined with the infrared detector built-in three-level thermoelectric cooler, the photosensitive surface temperature of the infrared detector is cooled to below -60°C by a method of constant current driving. In order to ensure the measurement accuracy of infrared radiation polarization, the short-term temperature fluctuation of the photosensitive surface of the infrared detector is required to be less than 0.03°C/s. This article has designed the infrared detector temperature control scheme verification test, and actually measured the stability of infrared detector temperature and dark current. The results of the simulation and tests show that the range of infrared detector heat sink temperature is - 25±5°C, the range of infrared detector photosensitive surface temperature is -65°C ~ -75°C,the rate of short-term temperature change of the infrared detector photo-sensitive surface is better than 0.01°C/s, and the dark current fluctuation is less than 1.3pA. Satisfying the on-orbit high-precision polarization measurement requirements.

Paper Details

Date Published: 12 March 2019
PDF: 7 pages
Proc. SPIE 11023, Fifth Symposium on Novel Optoelectronic Detection Technology and Application, 1102309 (12 March 2019); doi: 10.1117/12.2517932
Show Author Affiliations
Shuang-shuang Zhu, Univ. of Science and Technology of China (China)
Anhui Institute of Optics and Fine Mechanics (China)
Peng Zou, Anhui Institute of Optics and Fine Mechanics (China)
Mao-xin Song, Anhui Institute of Optics and Fine Mechanics (China)
Kai-xuan Zhao, Shanghai Satellite Equipment Research Institute (China)
Ming-chun Ling, Univ. of Science and Technology of China (China)
Anhui Institute of Optics and Fine Mechanics (China)
Zhen-hai Liu, Anhui Institute of Optics and Fine Mechanics (China)
Zhen-wei Qiu, Anhui Institute of Optics and Fine Mechanics (China)
Jin Hong, Anhui Institute of Optics and Fine Mechanics (China)


Published in SPIE Proceedings Vol. 11023:
Fifth Symposium on Novel Optoelectronic Detection Technology and Application
Qifeng Yu; Wei Huang; You He, Editor(s)

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