
Proceedings Paper
Improved design principle of Dyson concentric infrared imaging spectrometerFormat | Member Price | Non-Member Price |
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Paper Abstract
Dyson concentric configuration has advantages of 1:1 magnification ratio, compact size, light mass, large numerical aperture, less smile and distortion. However, volume of initial structure calculated by two-wavelength astigmatism method is relatively large. Meanwhile, we only obtain one smaller structure for long wavelength infrared range through another improved method widening aberrations. In this paper, we proposed improved design principle of Dyson concentric push-broom infrared imaging spectrometer, which can calculate all smaller initial Dyson structures satisfying requirements of spectral range and resolution in different infrared wavebands. First, obtain initial grating groove density using two-wavelength astigmatism. Then widening aberration, search all of initial Dyson structures satisfying ideal imaging condition under 1 to 10 times of initial grating groove density. Lastly, select infrared materials and detectors suitable for short infrared, medium-wave infrared and long-wave infrared wavebands respectively to demonstrate feasibility of this new method. As results shown, volume of Dyson configuration has reduced about 60% in short-wave infrared waveband, 77% in mid-wave infrared waveband, about 50% in long-wave infrared waveband. So improved design principle proposed in this paper benefits for infrared concentric imaging spectrometer. © 2018 Optical Society of America.
Paper Details
Date Published: 7 March 2019
PDF: 7 pages
Proc. SPIE 11053, Tenth International Symposium on Precision Engineering Measurements and Instrumentation, 1105312 (7 March 2019); doi: 10.1117/12.2517532
Published in SPIE Proceedings Vol. 11053:
Tenth International Symposium on Precision Engineering Measurements and Instrumentation
Jiubin Tan; Jie Lin, Editor(s)
PDF: 7 pages
Proc. SPIE 11053, Tenth International Symposium on Precision Engineering Measurements and Instrumentation, 1105312 (7 March 2019); doi: 10.1117/12.2517532
Show Author Affiliations
Qian Zhou, Graduate School at Shenzhen, Tsinghua Univ. (China)
Peng Yan, Graduate School at Shenzhen, Tsinghua Univ. (China)
Zhijie Yang, Graduate School at Shenzhen, Tsinghua Univ. (China)
Peng Yan, Graduate School at Shenzhen, Tsinghua Univ. (China)
Zhijie Yang, Graduate School at Shenzhen, Tsinghua Univ. (China)
Kai Ni, Graduate School at Shenzhen, Tsinghua Univ. (China)
Xinghui Li, Graduate School at Shenzhen, Tsinghua Univ. (China)
Xiaohao Wang, Graduate School at Shenzhen, Tsinghua Univ. (China)
Xinghui Li, Graduate School at Shenzhen, Tsinghua Univ. (China)
Xiaohao Wang, Graduate School at Shenzhen, Tsinghua Univ. (China)
Published in SPIE Proceedings Vol. 11053:
Tenth International Symposium on Precision Engineering Measurements and Instrumentation
Jiubin Tan; Jie Lin, Editor(s)
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