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Proceedings Paper

High-index-contrast dielectric metasurface optics for MWIR imaging (Conference Presentation)

Paper Abstract

The mid-wave infrared (MWIR) is an important band for numerous applications ranging from night vision to biochemical sensing. However, unlike visible or near-infrared (NIR) optical parts, which are economically available off the shelf, MWIR optics are plagued by much higher costs and often inferior performance compared to their visible or NIR counterparts. Optical metasurfaces, artificial materials with subwavelength-scale thicknesses and on-demand electromagnetic responses, provide a promising solution for cost-effective, high-performance infrared optics. Using high-refractive-index (> 5) chalcogenide materials deposited on IR-transparent substrates, we have experimentally demonstrated a MWIR transmissive metasurface device with diffraction-limited focusing and imaging performance and optical efficiency up to 75%. We further show that the metasurface design can accommodate ultra-wide field-of-view and the fabrication method can be extended to conformal integration of metasurface optics on curved surfaces. The projected size, weight and power advantages, coupled with the manufacturing scalability leveraging standard microfabrication technologies, makes the meta-optical devices promising for next-generation MWIR system applications.

Paper Details

Date Published: 14 May 2019
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Proc. SPIE 10998, Advanced Optics for Imaging Applications: UV through LWIR IV, 109980G (14 May 2019); doi: 10.1117/12.2516557
Show Author Affiliations
Mikhail Shalaginov, Massachusetts Institute of Technology (United States)
Sensong An, Univ. of Massachusetts Lowell (United States)
Lan Li, Massachusetts Institute of Technology (United States)
Hanyu Zheng, Massachusetts Institute of Technology (United States)
Jun Ding, Univ. of Massachusetts Lowell (United States)
Li Zhang, Massachusetts Institute of Technology (United States)
Clara Rivero-Baleine, Lockheed Martin Corp. (United States)
Tian Gu, Massachusetts Institute of Technology (United States)
Hualiang Zhang, Univ. of Massachusetts Lowell (United States)
Juejun Hu, Massachusetts Institute of Technology (United States)


Published in SPIE Proceedings Vol. 10998:
Advanced Optics for Imaging Applications: UV through LWIR IV
Jay N. Vizgaitis; Peter L. Marasco; Jasbinder S. Sanghera, Editor(s)

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