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Proceedings Paper

BABAR: black array of broadband absolute radiometers for far infrared sensing
Author(s): Christopher S. Yung; Nathan A. Tomlin; Cameron Straatsma; Joel Rutkowski; Erik C. Richard; David M. Harber; John H. Lehman; Michelle S. Stephens
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Paper Abstract

Currently at NIST, there is an effort to develop a black array of broadband absolute radiometers (BABAR) for far infrared sensing. The linear array of radiometer elements is based on uncooled vanadium oxide (VOx) microbolometer pixel technology but with the addition of two elements: vertically aligned carbon nanotubes (VACNTs) and an electrical substitution heater. Traditional microbolometer pixels use a thermistor film as an absorber, which is placed a quarter wavelength above a reflector, typically limiting absorption to a narrow band from 8 μm to 15 μm. To extend the sensing range of the imaging array into the far infrared (20 μm to 100 μm), we are replacing the cavity with a single absorber of VACNTs. In addition, each pixel has an electrical substitution heater which can be used to determine equivalent incident optical power when the device is non-illuminated. This device forms the basis of an absolute radiometer eliminating the need for an external reference (e.g. blackbody source).

Paper Details

Date Published: 13 May 2019
PDF: 6 pages
Proc. SPIE 10980, Image Sensing Technologies: Materials, Devices, Systems, and Applications VI, 109800F (13 May 2019); doi: 10.1117/12.2516047
Show Author Affiliations
Christopher S. Yung, National Institute of Standards and Technology (United States)
Nathan A. Tomlin, National Institute of Standards and Technology (United States)
Cameron Straatsma, Lab. for Atmospheric and Space Physics (United States)
Joel Rutkowski, Lab. for Atmospheric and Space Physics (United States)
Erik C. Richard, Lab. for Atmospheric and Space Physics (United States)
David M. Harber, Lab. for Atmospheric and Space Physics (United States)
John H. Lehman, National Institute of Standards and Technology (United States)
Michelle S. Stephens, National Institute of Standards and Technology (United States)


Published in SPIE Proceedings Vol. 10980:
Image Sensing Technologies: Materials, Devices, Systems, and Applications VI
Nibir K. Dhar; Achyut K. Dutta; Sachidananda R. Babu, Editor(s)

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