Proceedings Paper
High-sensitivity atomic magnetometers and gradiometers with spin entanglement (Conference Presentation)
Paper Abstract
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Paper Details
Date Published: 4 March 2019
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Proc. SPIE 10934, Optical, Opto-Atomic, and Entanglement-Enhanced Precision Metrology, 1093405 (4 March 2019); doi: 10.1117/12.2515662
Published in SPIE Proceedings Vol. 10934:
Optical, Opto-Atomic, and Entanglement-Enhanced Precision Metrology
Selim M. Shahriar; Jacob Scheuer, Editor(s)
Proc. SPIE 10934, Optical, Opto-Atomic, and Entanglement-Enhanced Precision Metrology, 1093405 (4 March 2019); doi: 10.1117/12.2515662
Show Author Affiliations
Michael Romalis, Princeton Univ. (United States)
Published in SPIE Proceedings Vol. 10934:
Optical, Opto-Atomic, and Entanglement-Enhanced Precision Metrology
Selim M. Shahriar; Jacob Scheuer, Editor(s)
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