
Proceedings Paper
An active optical frequency reference using a pulsed superradiant laserFormat | Member Price | Non-Member Price |
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Paper Abstract
We will describe a next-generation active atomic frequency reference based on super-radiant pulses of laser light from the ultra-narrow, 1 mHz linewidth, optical clock transition in an ensemble of cold 87Sr atoms. Light is stimulated from the millihertz linewidth transition by confining an ensemble of laser cooled atoms inside of a high finesse optical cavity. Such a light source has been proposed as a next-generation active atomic frequency reference, with the potential to enable high-precision optical frequency references to be used outside laboratory environments. We achieve a remarkable short term fractional frequency stability, 6.7 × 1016 at 1 s of averaging, absolute accuracy, 2 Hz (4 × 1015 fractional frequency), and high insensitivity to changes in the cavity length that limits the performance of todays more stable lasers. We will also discuss current work on cavity-enhanced dispersive measurements to perform high resolution spectroscopy and atom counting.
Paper Details
Date Published: 1 March 2019
PDF: 9 pages
Proc. SPIE 10934, Optical, Opto-Atomic, and Entanglement-Enhanced Precision Metrology, 109342B (1 March 2019); doi: 10.1117/12.2515582
Published in SPIE Proceedings Vol. 10934:
Optical, Opto-Atomic, and Entanglement-Enhanced Precision Metrology
Selim M. Shahriar; Jacob Scheuer, Editor(s)
PDF: 9 pages
Proc. SPIE 10934, Optical, Opto-Atomic, and Entanglement-Enhanced Precision Metrology, 109342B (1 March 2019); doi: 10.1117/12.2515582
Show Author Affiliations
Juan A. Muniz , JILA, NIST, Univ. of Colorado (United States)
Julia R. K. Cline, JILA, NIST, Univ. of Colorado (United States)
Julia R. K. Cline, JILA, NIST, Univ. of Colorado (United States)
Matthew A. Norcia, JILA, NIST, Univ. of Colorado (United States)
James K. Thompson, JILA, NIST, Univ. of Colorado (United States)
James K. Thompson, JILA, NIST, Univ. of Colorado (United States)
Published in SPIE Proceedings Vol. 10934:
Optical, Opto-Atomic, and Entanglement-Enhanced Precision Metrology
Selim M. Shahriar; Jacob Scheuer, Editor(s)
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