Proceedings Paper
Structured neutron waves| Format | Member Price | Non-Member Price |
|---|---|---|
| $17.00 | $21.00 |
Paper Abstract
Emerging quantum materials are becoming the building blocks for quantum devices and they are enabling new advances from spintronics to topological insulators. Their functionality typically comes from their inner magnetic field structure. Neutrons are a particularly good probe to characterize such features. The control of neutron orbital angular momentum and the spin-orbit interaction enables new characterizing techniques and increased sensitivity towards specific material properties. Here we review the preparation and characterization methods of structured neutron waves.
Paper Details
Date Published: 1 March 2019
PDF: 9 pages
Proc. SPIE 10934, Optical, Opto-Atomic, and Entanglement-Enhanced Precision Metrology, 1093425 (1 March 2019); doi: 10.1117/12.2515469
Published in SPIE Proceedings Vol. 10934:
Optical, Opto-Atomic, and Entanglement-Enhanced Precision Metrology
Selim M. Shahriar; Jacob Scheuer, Editor(s)
PDF: 9 pages
Proc. SPIE 10934, Optical, Opto-Atomic, and Entanglement-Enhanced Precision Metrology, 1093425 (1 March 2019); doi: 10.1117/12.2515469
Show Author Affiliations
Dusan Sarenac, Univ. of Waterloo (Canada)
Charles W. Clark, National Institute of Standards and Technology (United States)
David G. Cory, Univ. of Waterloo (Canada)
Perimeter Institute for Theoretical Physics (Canada)
Canadian Institute for Advanced Research (Canada)
Connor Kapahi, Univ. of Waterloo (Canada)
Benjamin Heacock, North Carolina State Univ. (United States)
Triangle Univ. Nuclear Lab. (United States)
Charles W. Clark, National Institute of Standards and Technology (United States)
David G. Cory, Univ. of Waterloo (Canada)
Perimeter Institute for Theoretical Physics (Canada)
Canadian Institute for Advanced Research (Canada)
Connor Kapahi, Univ. of Waterloo (Canada)
Benjamin Heacock, North Carolina State Univ. (United States)
Triangle Univ. Nuclear Lab. (United States)
Michael G. Huber, National Institute of Standards and Technology (United States)
Joachim Nsofini, Univ. of Waterloo (Canada)
Chandra B. Shahi, Univ. of Maryland, College Park (Canada)
Dmitry A. Pushin, Univ. of Waterloo (Canada)
Joachim Nsofini, Univ. of Waterloo (Canada)
Chandra B. Shahi, Univ. of Maryland, College Park (Canada)
Dmitry A. Pushin, Univ. of Waterloo (Canada)
Published in SPIE Proceedings Vol. 10934:
Optical, Opto-Atomic, and Entanglement-Enhanced Precision Metrology
Selim M. Shahriar; Jacob Scheuer, Editor(s)
© SPIE. Terms of Use
