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Proceedings Paper

Speckle-based spectrometer (Conference Presentation)
Author(s): Hui Cao

Paper Abstract

A speckle pattern denotes a random granular distribution of intensity generated, e.g., by light scattered from a disordered structure or transmitted through a multimode fiber. Its spectral sensitivity has been used to retrieve the spectrum of light that creates it. We have developed three types of speckle-based spectrometers. The first one is a chip-scale random spectrometer that enhances spectral sensitivity by multiple scattering of light. The second type utilizes a multimode optical fiber to achieve the record-high resolution. The third one is based on an evanescently-coupled multimode spiral waveguide. The speckle-based spectrometer has been applied to the ultrahigh-resolution frequency-comb spectroscopy.

Paper Details

Date Published: 4 March 2019
Proc. SPIE 10934, Optical, Opto-Atomic, and Entanglement-Enhanced Precision Metrology, 1093415 (4 March 2019); doi: 10.1117/12.2515430
Show Author Affiliations
Hui Cao, Yale Univ. (United States)

Published in SPIE Proceedings Vol. 10934:
Optical, Opto-Atomic, and Entanglement-Enhanced Precision Metrology
Selim M. Shahriar; Jacob Scheuer, Editor(s)

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