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Proceedings Paper

Pattern spectrum morphology for texture discrimination and object recognition
Author(s): Bonita G. Lee; Victor T. Tom
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Paper Abstract

The pattern spectrum describes the shape and size of structures in an n-dimensional signal. Measurement of the pattern spectrum is based on morphological operations which use a variety of structuring elements to filter a signal at multiple spatial scales. This paper reports on the use of pattern spectra in the grayscale domain for classifying different textures and in the binary domain for object recognition. The advantage of morphological image processing is that it is based on highly parallel primitive operations which are amenable to large-scale implementation in real-time signal processing hardware.

Paper Details

Date Published: 1 February 1991
PDF: 12 pages
Proc. SPIE 1381, Intelligent Robots and Computer Vision IX: Algorithms and Techniques, (1 February 1991);
Show Author Affiliations
Bonita G. Lee, Atlantic Aerospace Electronics Corp. (United States)
Victor T. Tom, Atlantic Aerospace Electronics Corp. (United States)

Published in SPIE Proceedings Vol. 1381:
Intelligent Robots and Computer Vision IX: Algorithms and Techniques
David P. Casasent, Editor(s)

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