
Proceedings Paper
Design and performance analysis of a novel thermos-structure for measuring thermal drift of optics in a next generation interferometerFormat | Member Price | Non-Member Price |
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Paper Abstract
In this paper, a design of a novel thermo-structure for measuring thermal drift of optics in a next generation interferometer is presented. The novel thermo-structure is used to change the temperature of interferometer under test (IUT) by radiation since the measurement is operated in vacuum to exclude the affect from air. Besides, the thermo-structure is made of multilayers, intergrated with thermo electric coolers as the source of heat, which can provide a uniform temperature field. In addition, the thermo-structure can also protect the IUT from disturbance of environmental radiation. Performance of the system is evaluated by finite element analysis and simulation results show that it can achieve a uniform temperature field which temperature difference is less than 0.02°C and reduce perturbation of environmental radiation from 2°C down to 0.03°C.
Paper Details
Date Published: 7 March 2019
PDF: 8 pages
Proc. SPIE 11053, Tenth International Symposium on Precision Engineering Measurements and Instrumentation, 110534G (7 March 2019); doi: 10.1117/12.2513410
Published in SPIE Proceedings Vol. 11053:
Tenth International Symposium on Precision Engineering Measurements and Instrumentation
Jiubin Tan; Jie Lin, Editor(s)
PDF: 8 pages
Proc. SPIE 11053, Tenth International Symposium on Precision Engineering Measurements and Instrumentation, 110534G (7 March 2019); doi: 10.1117/12.2513410
Show Author Affiliations
Guolong Wu, Harbin Institute of Technology (China)
Hongxing Yang, Harbin Institute of Technology (China)
Haijin Fu, Harbin Institute of Technology (China)
Hongxing Yang, Harbin Institute of Technology (China)
Haijin Fu, Harbin Institute of Technology (China)
Pengcheng Hu, Harbin Institute of Technology (China)
Xuemei Ding, Harbin Institute of Technology (China)
Xuemei Ding, Harbin Institute of Technology (China)
Published in SPIE Proceedings Vol. 11053:
Tenth International Symposium on Precision Engineering Measurements and Instrumentation
Jiubin Tan; Jie Lin, Editor(s)
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