The structured illumination microscopy fills an unmet need for minimally invasive tools to image micrometer and nanoscale structure. However, conventional structured illumination super-resolution methods require precise phase shift of the illumination pattern, which leads to an inefficient image reconstruction process and a complicated imaging system. To solve these problems, we propose a novel image reconstruction method using only two image to acquire the frequencies beyond the diffraction limit. This method has an efficient image post-processing, which obtains extended frequencies without accurate estimation of phase-shifting. The related simulations and experiments are carried out to demonstrate the feasibility of this method.

Date Published: 30 January 2019
PDF: 7 pages
Proc. SPIE 10841, 9th International Symposium on Advanced Optical Manufacturing and Testing Technologies: Meta-Surface-Wave and Planar Optics, 108410H (30 January 2019); doi: 10.1117/12.2512326

Published in SPIE Proceedings Vol. 10841:
9th International Symposium on Advanced Optical Manufacturing and Testing Technologies: Meta-Surface-Wave and Planar Optics
Mingbo Pu; Xiaoliang Ma; Xiong Li; Minghui Hong; Changtao Wang; Xiangang Luo, Editor(s)