
Proceedings Paper
Development of portable digital ultrasonic guided wave detector based on COM ExpressFormat | Member Price | Non-Member Price |
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Paper Abstract
This paper proposes a portable ultrasonic guided wave detector based on ADLINK COM Express (Computer On Module Express) computer module. This detector is equipped with Windows7 operating system and uses the PCIe (Peripheral Component Interconnect Express) bus as the FPGA (Field Programmable Gate Array) of COM Express and Xilinx. The data transmission rate can reach 500MB/s in the transmission line. In addition, a self-developed high-voltage pulse signal generation circuit and signal acquisition circuit are used in the analog circuit. Finally, this developed detector is used to excite ultrasonic guided waves in the aluminum plate and the pipe to realize the identification of defect echo signals in these two structures, which verify the reliability of the designed detector.
Paper Details
Date Published: 7 March 2019
PDF: 7 pages
Proc. SPIE 11053, Tenth International Symposium on Precision Engineering Measurements and Instrumentation, 110533M (7 March 2019); doi: 10.1117/12.2512177
Published in SPIE Proceedings Vol. 11053:
Tenth International Symposium on Precision Engineering Measurements and Instrumentation
Jiubin Tan; Jie Lin, Editor(s)
PDF: 7 pages
Proc. SPIE 11053, Tenth International Symposium on Precision Engineering Measurements and Instrumentation, 110533M (7 March 2019); doi: 10.1117/12.2512177
Show Author Affiliations
Meiju Zhang, Beijing Aeronautical Manufacturing Technology Research Institute (China)
Wei Liu, Beijing Aeronautical Manufacturing Technology Research Institute (China)
Defeng Liu, Beijing Aeronautical Manufacturing Technology Research Institute (China)
Wei Liu, Beijing Aeronautical Manufacturing Technology Research Institute (China)
Defeng Liu, Beijing Aeronautical Manufacturing Technology Research Institute (China)
Feiyue An, Beijing Univ. of Technology (China)
Honglei Chen, Beijing Univ. of Technology (China)
Zenghua Liu, Beijing Univ. of Technology (China)
Honglei Chen, Beijing Univ. of Technology (China)
Zenghua Liu, Beijing Univ. of Technology (China)
Published in SPIE Proceedings Vol. 11053:
Tenth International Symposium on Precision Engineering Measurements and Instrumentation
Jiubin Tan; Jie Lin, Editor(s)
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