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Proceedings Paper

Measurement method of the compression coefficient of near-monocrystalline silicon density liquid
Author(s): Xin-yu Ma; Jin-Tao WANG; Zhi-Yong Luo
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Paper Abstract

The standard near-silicon liquid (2329kg/m3) is a mixture liquid of tribromopropane and dibromoethane in a certain proportion. This liquid is used to measure the density of single crystal silicon spheres by a static suspension method and the analysis of the difference in the micro density between two silicon spheres. Measuring the difference in the micro-density of the silicon spheres is of great significance for the new definition of the new mass of kilograms. In order to obtain the micro-density difference of the silicon spheres, it is necessary to calculate the static pressure value and the temperature by separately adjusting the singlecrystal silicon spheres to the same suspension state and the compression coefficient of the near-monocrystalline silicon density liquid. Through the adjustment of the same hydrostatic suspension state of a single silica ball in different suspension states, the linear constants measured by the linear model are analyzed to calculate the liquid compression coefficient. For this purpose, a static suspension measuring device for a single crystal silicon ball was designed to maintain the water bath within a range of ±0.1mk within 3 hours, and the position control of the silicon ball was determined by controlling the pressure of the upper computer.

Paper Details

Date Published: 7 March 2019
PDF: 6 pages
Proc. SPIE 11053, Tenth International Symposium on Precision Engineering Measurements and Instrumentation, 1105334 (7 March 2019); doi: 10.1117/12.2512095
Show Author Affiliations
Xin-yu Ma, National Institute of Metrology (China)
China Jiliang Univ. (China)
Jin-Tao WANG, National Institute of Metrology (China)
Zhi-Yong Luo, National Institute of Metrology (China)


Published in SPIE Proceedings Vol. 11053:
Tenth International Symposium on Precision Engineering Measurements and Instrumentation
Jiubin Tan; Jie Lin, Editor(s)

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