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Proceedings Paper

Phase measuring method and error compensation in 3D profile measurement
Author(s): Yan Zhang; Zili Zhang; Yueqiang Li; Weihu Zhou; Yang He; Wei Li
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Paper Abstract

3D profile measurement is widely used in many areas such as manufacturing, computer-aided design, virtual reality and medical diagnostics. As one of the core technologies in 3D profile measurement, digital fringe pattern projection is a highly sensitive noncontact technique for obtaining the 3D shape of an object. Then the grating pattern deformed by the measured object is captured by CCD cameras and decoded using appropriate algorithms so that the shape of the object can be deduced. In this paper, three sets of phase shift fringe patterns with different frequencies are projected on the surface of the measured object by a DLP projector and the deformed patterns are captured by two cameras. Then the four-step phase shift method is used to obtain the three groups of fringe patterns phases, and the three-frequency heterodyne method is adopted to unwrap the phase and obtain the absolute phase. The causes of the phase errors are analyzed and the subsequent compensation method of gamma correction of grating pattern is proposed to eliminate the main errors. Experiments are carried out and the results verify the accuracy and effectiveness of the proposed methods.

Paper Details

Date Published: 7 March 2019
PDF: 9 pages
Proc. SPIE 11053, Tenth International Symposium on Precision Engineering Measurements and Instrumentation, 110532X (7 March 2019); doi: 10.1117/12.2512073
Show Author Affiliations
Yan Zhang, Beijing Information Science & Technology Univ. (China)
Zili Zhang, Academy of Opto-Electronics (China)
Univ. of Chinese Academy of Sciences (China)
Yueqiang Li, Beijing Information Science & Technology Univ. (China)
Weihu Zhou, Academy of Opto-Electronics (China)
Univ. of Chinese Academy of Sciences (China)
Yang He, Beijing Information Science & Technology Univ. (China)
Wei Li, Beijing Information Science & Technology Univ. (China)


Published in SPIE Proceedings Vol. 11053:
Tenth International Symposium on Precision Engineering Measurements and Instrumentation
Jiubin Tan; Jie Lin, Editor(s)

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