
Proceedings Paper
Dual-wavelength off-axis quasi-common path digital holography using polarization multiplexing and flippingFormat | Member Price | Non-Member Price |
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Paper Abstract
We build a two-wavelength off-axis quasi-common-path digital holography for quantitative phase imaging (QPI) using polarization-multiplexing and flipping. The interference is performed by flipping the relative position of a sample and reference beam, and the dual-wavelength information is spatially multiplexed onto a monochromatic CCD camera simultaneously using polarization-multiplexing. Due to orthogonal interference fringes of two-wavelengths, the unwrapped information on the phase and thickness for the sample can be extracted from a single interferogram. Our setup requires no pinholes, gratings or dichroic mirror with straightforward alignment. Additionally, a division algorithm for dual-wavelength off-axis digital holography with the help of a specimen-free multiplexed interferogram is proposed to extract the phase of a specimen. We demonstrate the operation of the setup with step target and circular pillar.
Paper Details
Date Published: 7 March 2019
PDF: 5 pages
Proc. SPIE 11053, Tenth International Symposium on Precision Engineering Measurements and Instrumentation, 110530O (7 March 2019); doi: 10.1117/12.2512018
Published in SPIE Proceedings Vol. 11053:
Tenth International Symposium on Precision Engineering Measurements and Instrumentation
Jiubin Tan; Jie Lin, Editor(s)
PDF: 5 pages
Proc. SPIE 11053, Tenth International Symposium on Precision Engineering Measurements and Instrumentation, 110530O (7 March 2019); doi: 10.1117/12.2512018
Show Author Affiliations
Lei Liu, Harbin Engineering Univ. (China)
Zhi Zhong, Harbin Engineering Univ. (China)
Mingguang Shan, Harbin Engineering Univ. (China)
Bin Liu, Harbin Engineering Univ. (China)
Zhi Zhong, Harbin Engineering Univ. (China)
Mingguang Shan, Harbin Engineering Univ. (China)
Bin Liu, Harbin Engineering Univ. (China)
Guangyu Luan, Heilongjiang Bayi Agricultural Univ. (China)
Ming Diao, Harbin Engineering Univ. (China)
Yabin Zhang, Harbin Engineering Univ. (China)
Ming Diao, Harbin Engineering Univ. (China)
Yabin Zhang, Harbin Engineering Univ. (China)
Published in SPIE Proceedings Vol. 11053:
Tenth International Symposium on Precision Engineering Measurements and Instrumentation
Jiubin Tan; Jie Lin, Editor(s)
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