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Proceedings Paper

Removing baseline and apodization in process of data retrieval of Doppler asymmetric spatial heterodyne spectrometer
Author(s): Shuna Wang; Jiejing Chen
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Paper Abstract

Doppler asymmetric spatial heterodyne spectroscopy (DASH) realizes atmospheric wind field detection utilizing Doppler effect. In process of atmospheric wind velocity retrieval, the raw interferogram contains the low frequency baseline and the tempolabile background. And the truncation effect of spectrometer can bring in spiculate discontinuity on the edge of the range of the raw interferogram. These problems have impact on working out the phase information of the target spectral line accurately. Meanwhile, there are stray spectral lines and noise in the recovered spectrum, which make the phase of the interferogram change and the retrieved wind velocity mistake. Therefore, it is necessary to discuss the method ofremoving baseline and apodization in process of getting the phase information of the recovered spectrum in actual noisy environment. The results indicate that the optimizations of high-pass filtering method and least square fitting method are similar, while calculus of differences method is better than both of them in the aspect of removing baseline. As for the method of apodization, the overall performances of Hanning window, Hamming window and triangular window are better than other apodization functions and the optimizing effects are more stable. The inversion accuracy of algorithm is increased by 30% as the first-order differential filtering method is used to remove the low frequency baseline and the Hanning window is used to apodize.

Paper Details

Date Published: 8 February 2019
PDF: 10 pages
Proc. SPIE 10843, 9th International Symposium on Advanced Optical Manufacturing and Testing Technologies: Optoelectronic Materials and Devices for Sensing and Imaging, 108431Q (8 February 2019); doi: 10.1117/12.2511939
Show Author Affiliations
Shuna Wang, Changchun Univ. of Science and Technology (China)
Jiejing Chen, Xi'an Institute of Applied Optics (China)


Published in SPIE Proceedings Vol. 10843:
9th International Symposium on Advanced Optical Manufacturing and Testing Technologies: Optoelectronic Materials and Devices for Sensing and Imaging
Yadong Jiang; Xiaoliang Ma; Xiong Li; Mingbo Pu; Xue Feng; Bernard Kippelen, Editor(s)

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