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Proceedings Paper

Background radiation response evaluation of InGaAs detectors
Author(s): Hao Dong; Zhenghai Liu; Peng Zou; Jin Hong
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Paper Abstract

The basic principle of evaluating the background radiation response of the InGaAs detector is introduced. Based on the structure characteristics of the InGaAs detector, the background radiation response calculation model is established. A background radiation response assessment scheme was designed and a test system was designed. Based on the effect of dark current output of the detector, the background radiation output of the InGaAs detector at different temperatures was measured. The results showed that the theoretical calculations of the background radiation response were consistent with the measured values. It provides data support for setting and parameter evaluation of InGaAs detector conditions.

Paper Details

Date Published: 7 November 2018
PDF: 10 pages
Proc. SPIE 10832, Fifth Conference on Frontiers in Optical Imaging Technology and Applications, 108321Q (7 November 2018); doi: 10.1117/12.2511867
Show Author Affiliations
Hao Dong, Anhui Institute of Optics and Fine Mechanics (China)
Univ. of Science and Technology of China (China)
Zhenghai Liu, Anhui Institute of Optics and Fine Mechanics (China)
Peng Zou, Anhui Institute of Optics and Fine Mechanics (China)
Jin Hong, Anhui Institute of Optics and Fine Mechanics (China)


Published in SPIE Proceedings Vol. 10832:
Fifth Conference on Frontiers in Optical Imaging Technology and Applications
Junhao Chu; Wenqing Liu; Huilin Jiang, Editor(s)

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