
Proceedings Paper
Study on the applications of space-based polarization detection techniqueFormat | Member Price | Non-Member Price |
---|---|---|
$17.00 | $21.00 |
Paper Abstract
Polarization Detection is a new remote sensing technique. There is a huge potential for application in space-based imaging, material recognition and clutter suppression. This article presents a simulation study of polarization characteristics distribution and space-based polarization detection of typical materials. In order to provide technical support for space-based applications of polarization detection technique, the main technical indicators of space-based polarization detection were carded and analyzed.
Paper Details
Date Published: 7 November 2018
PDF: 7 pages
Proc. SPIE 10832, Fifth Conference on Frontiers in Optical Imaging Technology and Applications, 108321M (7 November 2018); doi: 10.1117/12.2511759
Published in SPIE Proceedings Vol. 10832:
Fifth Conference on Frontiers in Optical Imaging Technology and Applications
Junhao Chu; Wenqing Liu; Huilin Jiang, Editor(s)
PDF: 7 pages
Proc. SPIE 10832, Fifth Conference on Frontiers in Optical Imaging Technology and Applications, 108321M (7 November 2018); doi: 10.1117/12.2511759
Show Author Affiliations
Hailong Yang Sr., Shanghai Institute of Satellite Engineering (China)
Shasha Zhu, Shanghai Institute of Satellite Engineering (China)
Chao Chen, Shanghai Institute of Satellite Engineering (China)
Shasha Zhu, Shanghai Institute of Satellite Engineering (China)
Chao Chen, Shanghai Institute of Satellite Engineering (China)
Zhaoyong Dong, Shanghai Institute of Satellite Engineering (China)
Xiao Zhao, Shanghai Institute of Satellite Engineering (China)
Xianglong Kong, Shanghai Institute of Satellite Engineering (China)
Xiao Zhao, Shanghai Institute of Satellite Engineering (China)
Xianglong Kong, Shanghai Institute of Satellite Engineering (China)
Published in SPIE Proceedings Vol. 10832:
Fifth Conference on Frontiers in Optical Imaging Technology and Applications
Junhao Chu; Wenqing Liu; Huilin Jiang, Editor(s)
© SPIE. Terms of Use
