Share Email Print
cover

Proceedings Paper

Uncertainty of measurement for testing sensitivity of low light level image intensifier
Author(s): Xiaofeng Bai Sr.; Hui Guo; Shuning Yang; Xulang Chen; Wujun Huang; Qingyun Meng; Yingping He
Format Member Price Non-Member Price
PDF $17.00 $21.00

Paper Abstract

It is essential to measure the sensitivity accurately, because sensitivity is an important index of low light level image intensifier for evaluating the photocathode’s responsiveness. In this article, the economic testing equipment has been founded on the method required in the military standards, the way to select parameters of measurement have been shown, and the uncertainty of measurement for testing sensitivity has been analyzed. The expanded uncertainty, which is only below 4.6%, can completely satisfied to the requirement of high precision testing.

Paper Details

Date Published: 7 November 2018
PDF: 7 pages
Proc. SPIE 10832, Fifth Conference on Frontiers in Optical Imaging Technology and Applications, 108321G (7 November 2018); doi: 10.1117/12.2511492
Show Author Affiliations
Xiaofeng Bai Sr., Kunming Institute of Physics (China)
Hui Guo, Kunming Institute of Physics (China)
Shuning Yang, Kunming Institute of Physics (China)
Xulang Chen, Kunming Institute of Physics (China)
Wujun Huang, Kunming Institute of Physics (China)
Qingyun Meng, Kunming Institute of Physics (China)
Yingping He, Kunming Institute of Physics (China)


Published in SPIE Proceedings Vol. 10832:
Fifth Conference on Frontiers in Optical Imaging Technology and Applications
Junhao Chu; Wenqing Liu; Huilin Jiang, Editor(s)

© SPIE. Terms of Use
Back to Top