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Proceedings Paper

Characterization of a liquid crystal variable retarder by Mueller matrix ellipsometry
Author(s): Peng Wei; Honggang Gu; Xiuguo Chen; Hao Jiang; Chuanwei Zhang; Shiyuan Liu
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Paper Abstract

With the maturing of liquid crystal technology, liquid crystal variable retarder (LCVR) has been widely used in optical systems. In practice, it is of great importance to characterize the polarization properties of the LCVR for its control and applications to accurately modulate the polarization state of the light in the optical systems. In this paper, the Mueller matrix ellipsometry (MME) is applied to comprehensively characterize the polarization properties including the retardance and the fast axis azimuth of the LCVR versus the driving voltage, the wavelength, as well as the incidence and the azimuth of the light. An analytical model is constructed to describe the LCVR based on the Mueller matrix calculus, in which the influences of the incidence and the azimuth of the light are considered. A house-developed spectroscopic Mueller matrix ellipsometer is employed to perform the experiments. Simulations and experiments about a commercial LCVR product are presented and discussed to verify the proposed method.

Paper Details

Date Published: 7 March 2019
PDF: 8 pages
Proc. SPIE 11053, Tenth International Symposium on Precision Engineering Measurements and Instrumentation, 110531Q (7 March 2019); doi: 10.1117/12.2511431
Show Author Affiliations
Peng Wei, Huazhong Univ. of Science and Technology (China)
Honggang Gu, Huazhong Univ. of Science and Technology (China)
Xiuguo Chen, Huazhong Univ. of Science and Technology (China)
Hao Jiang, Huazhong Univ. of Science and Technology (China)
Chuanwei Zhang, Huazhong Univ. of Science and Technology (China)
Shiyuan Liu, Huazhong Univ. of Science and Technology (China)


Published in SPIE Proceedings Vol. 11053:
Tenth International Symposium on Precision Engineering Measurements and Instrumentation
Jiubin Tan; Jie Lin, Editor(s)

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