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Proceedings Paper

Complicated intermittent scratches detection research on surface of optical components based on adaptive sector scanning algorithm cascading mean variance threshold algorithm
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Paper Abstract

In inertial confinement fusion system, the intermittent scratches on the polished surface of single-sided polished and bottom surface frosted optical components are complex, and it’s of great difficulty to extract them completely. In order to solve this problem, established in the light-field surface detection system, this paper brings forward a novel intermittent scratch detection method based on adaptive sector scanning algorithm (ASC) cascading mean variance threshold algorithm (MVTH). In the preprocessing step, dividing the original image into subimages with a number of integer multiple of cpu cores so as to fully compress image processing time utilizing parallel processing, using mean filter to balance background and then obtaining binary subimages utilizing morphology and threshold operations, finally, utilizing Two-pass algorithm to label the connected domains of binary subimages. In the detection step, considering the complexity of the pattern of intermittent scratches, ASC is first used for routine intermittent scratches stitching and then supplemented by MVTH. In the verification step, in order to prove that the detected intermittent scratches satisfy the criteria for scratches in human eyes, the method of support vector machine (SVM) pattern recognition is utilized to compare the detected results with the continuous scratch samples detected by human eyes. This algorithm has high degree of parallelism, high speed and strong robustness. The experimental results illustrate that the complete extraction rate of intermittent scratches is 93.59% , the average processing time of single image is merely 0.029 second and the accuracy rate of detection is up to 98.72% by SVM verification.

Paper Details

Date Published: 7 March 2019
PDF: 8 pages
Proc. SPIE 11053, Tenth International Symposium on Precision Engineering Measurements and Instrumentation, 110531L (7 March 2019); doi: 10.1117/12.2511381
Show Author Affiliations
Fanyi Wang, State Key Lab. of Modern Optical Instrumentation (China)
Pin Cao, Hangzhou Zernike Optical Technology Co., Ltd. (China)
Yongying Yang, State Key Lab. of Modern Optical Instrumentation (China)
Rongzhi Liu, State Key Lab. of Modern Optical Instrumentation (China)
Fan Wu, State Key Lab. of Modern Optical Instrumentation (China)
Pengfei Zhang, State Key Lab. of Modern Optical Instrumentation (China)
Jiabin Jiang, State Key Lab. of Modern Optical Instrumentation (China)
Huiting Chai, State Key Lab. of Modern Optical Instrumentation (China)
Yihui Zhang, State Key Lab. of Modern Optical Instrumentation (China)
Yubin Du, State Key Lab. of Modern Optical Instrumentation (China)
Guohua Feng, State Key Lab. of Modern Optical Instrumentation (China)
Xiang Xiao, State Key Lab. of Modern Optical Instrumentation (China)
Yanwei Li, State Key Lab. of Modern Optical Instrumentation (China)


Published in SPIE Proceedings Vol. 11053:
Tenth International Symposium on Precision Engineering Measurements and Instrumentation
Jiubin Tan; Jie Lin, Editor(s)

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